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  <title>Fordatis Sammlung:</title>
  <link rel="alternate" href="https://fordatis.fraunhofer.de/handle/fordatis/34" />
  <subtitle />
  <id>https://fordatis.fraunhofer.de/handle/fordatis/34</id>
  <updated>2026-09-22T20:01:08Z</updated>
  <dc:date>2026-09-22T20:01:08Z</dc:date>
  <entry>
    <title>Complex refractive indices of Spiro-TTB and C60</title>
    <link rel="alternate" href="https://fordatis.fraunhofer.de/handle/fordatis/248" />
    <author>
      <name>Sittinger, Volker</name>
    </author>
    <author>
      <name>Schulze, Patricia S.C.</name>
    </author>
    <author>
      <name>Messmer, Christoph A.</name>
    </author>
    <author>
      <name>Pflug, Andreas</name>
    </author>
    <author>
      <name>Goldschmidt, Jan Christoph</name>
    </author>
    <id>https://fordatis.fraunhofer.de/handle/fordatis/248</id>
    <updated>2023-02-24T03:15:54Z</updated>
    <published>2022-01-01T00:00:00Z</published>
    <summary type="text">Titel: Complex refractive indices of Spiro-TTB and C60
Datenautorinnen und Datenautoren: Sittinger, Volker; Schulze, Patricia S.C.; Messmer, Christoph A.; Pflug, Andreas; Goldschmidt, Jan Christoph
Zusammenfassung: Combining spectrophotometry, variable angle spectroscopic ellipsometry, and X-ray reflectometry with an algorithm that simultaneously fits all available spectra we determine the complex refractive index of evaporated Spiro-TTB and C60 layers</summary>
    <dc:date>2022-01-01T00:00:00Z</dc:date>
  </entry>
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